A Built In Transient Power Supply Current Sensor For Cmos Srams

ABSTRACT: This thesis presents the implementation and simulation of a Built-in transient power supply current sensor for CMOS SRAM cells. By measuring the transient current coming from the power supply of an array of CMOS SRAM cells, the sensor is able to detect different types of defects present on the cells. By using the sensor, it is possible to improve efficiency of different testing methods, and also to reduce overall testing time.