Advanced Scanning Microscopy for Nanotechnology

Advanced Scanning Microscopy for Nanotechnology
Author: Weilie Zhou
Publisher:
Total Pages: 450
Release: 2007
Genre: Nanotechnology
ISBN: 9787040190083

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Advanced Scanning Microscopy for Nanotechnology
Language: en
Pages: 450
Authors: Weilie Zhou
Categories: Nanotechnology
Type: BOOK - Published: 2007 - Publisher:

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Scanning Microscopy for Nanotechnology
Language: en
Pages: 533
Authors: Weilie Zhou
Categories: Technology & Engineering
Type: BOOK - Published: 2007-03-09 - Publisher: Springer Science & Business Media

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the
Field Emission Scanning Electron Microscopy
Language: en
Pages: 143
Authors: Nicolas Brodusch
Categories: Technology & Engineering
Type: BOOK - Published: 2017-09-25 - Publisher: Springer

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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes
New Horizons of Applied Scanning Electron Microscopy
Language: en
Pages: 172
Authors: Kenichi Shimizu
Categories: Technology & Engineering
Type: BOOK - Published: 2009-11-19 - Publisher: Springer Science & Business Media

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In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures
Handbook of Microscopy for Nanotechnology
Language: en
Pages: 745
Authors: Nan Yao
Categories: Technology & Engineering
Type: BOOK - Published: 2006-07-12 - Publisher: Springer Science & Business Media

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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices