Applied Crystallography Xxi

Volume is indexed by Thomson Reuters CPCI-S (WoS). The goal of this collection is to provide an opportunity for researchers working in many different fields to showcase their latest achievements in the area of structural studies, as applied to the materials commonly used in industry. Emphasis is placed upon topics such as the development of methods and techniques in X-ray studies, crystal structure determination methods, the crystallography of phase transformations, texture analysis, material structures – metals and alloys, ceramics, polymers, thin films, quasicrystals, amorphous materials, nanomaterials and molecular crystals.