Applied Scanning Probe Methods XI

Applied Scanning Probe Methods XI
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
Total Pages: 281
Release: 2008-10-22
Genre: Technology & Engineering
ISBN: 3540850376

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.


Applied Scanning Probe Methods XI
Language: en
Pages: 281
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-22 - Publisher: Springer Science & Business Media

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a
Applied Scanning Probe Methods VII
Language: en
Pages: 0
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2010-11-23 - Publisher: Springer

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The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a
Applied Scanning Probe Methods II
Language: en
Pages: 456
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2006-06-22 - Publisher: Springer Science & Business Media

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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cisio
Applied Scanning Probe Methods XIII
Language: en
Pages: 284
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-29 - Publisher: Springer Science & Business Media

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out i
Applied Scanning Probe Methods X
Language: en
Pages: 475
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2007-12-20 - Publisher: Springer Science & Business Media

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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to sum