Characterization of Hot-carrier Reliability in Analog Sub-circuit Design

Characterization of Hot-carrier Reliability in Analog Sub-circuit Design
Author: Huy X. P. Le
Publisher:
Total Pages: 54
Release: 1996
Genre:
ISBN:
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Characterization of Hot-carrier Reliability in Analog Sub-circuit Design
Language: en
Pages: 54

Characterization of Hot-carrier Reliability in Analog Sub-circuit Design

Authors: Huy X. P. Le
Categories:
Type: BOOK - Published: 1996 - Publisher:

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Hot-carrier Reliability of Integrated Circuits
Language: en
Pages: 368

Hot-carrier Reliability of Integrated Circuits

Authors: Khandker Nazrul Quader
Categories:
Type: BOOK - Published: 1993 - Publisher:

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On the Methodology of Assessing Hot-carrier Reliability of Analog Circuits
Language: en
Pages: 232

On the Methodology of Assessing Hot-carrier Reliability of Analog Circuits

Authors: Huy X. P. Le
Categories:
Type: BOOK - Published: 1999 - Publisher:

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Analog IC Reliability in Nanometer CMOS
Language: en
Pages: 208

Analog IC Reliability in Nanometer CMOS

Authors: Elie Maricau
Categories: Technology & Engineering
Type: BOOK - Published: 2013-01-11 - Publisher: Springer Science & Business Media

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This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreli
IEEE TENCON 2003
Language: en
Pages: 434

IEEE TENCON 2003

Authors:
Categories: Artificial intelligence
Type: BOOK - Published: 2003 - Publisher: Allied Publishers

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