Characterization Of Hot Carriers Induced Degradation In Mosfets Through Gate Capacitances Measurement At Room And Cryogenic Temperatures
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Characterization of Hot-carriers Induced Degradation in Mosfets Through Gate Capacitances Measurement at Room and Cryogenic Temperatures
| Author | : Clement Che Ta Hsu |
| Publisher | : |
| Total Pages | : 220 |
| Release | : 2001 |
| Genre | : Hot-carriers |
| ISBN | : |
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