Defects in SiO2 and Related Dielectrics: Science and Technology

Defects in SiO2 and Related Dielectrics: Science and Technology
Author: Gianfranco Pacchioni
Publisher: Springer Science & Business Media
Total Pages: 619
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 9401009449

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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.


Defects in SiO2 and Related Dielectrics: Science and Technology
Language: en
Pages: 619
Authors: Gianfranco Pacchioni
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to
Defects in HIgh-k Gate Dielectric Stacks
Language: en
Pages: 495
Authors: Evgeni Gusev
Categories: Technology & Engineering
Type: BOOK - Published: 2006-02-15 - Publisher: Springer Science & Business Media

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The goal of this NATO Advanced Research Workshop (ARW) entitled “Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices”, which was hel
The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2
Language: en
Pages: 505
Authors: B.E. Deal
Categories: Science
Type: BOOK - Published: 2013-11-09 - Publisher: Springer Science & Business Media

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The first international symposium on the subject "The Physics and Chemistry of Si02 and the Si-Si02 Interface," organized in association with the Electrochemica
Nano and Giga Challenges in Microelectronics
Language: en
Pages: 264
Authors: J. Greer
Categories: Technology & Engineering
Type: BOOK - Published: 2003-10-24 - Publisher: Elsevier

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The book is designed as an introduction for engineers and researchers wishing to obtain a fundamental knowledge and a snapshot in time of the cutting edge in te
Spectroscopy for Materials Characterization
Language: en
Pages: 500
Authors: Simonpietro Agnello
Categories: Technology & Engineering
Type: BOOK - Published: 2021-09-08 - Publisher: John Wiley & Sons

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SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface scie