Design For Manufacturability And Yield For Nano Scale Cmos
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Design for Manufacturability and Yield for Nano-Scale CMOS
Author | : Charles Chiang |
Publisher | : Springer Science & Business Media |
Total Pages | : 277 |
Release | : 2007-06-15 |
Genre | : Technology & Engineering |
ISBN | : 1402051883 |
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This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
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