ESD Design and Analysis Handbook

ESD Design and Analysis Handbook
Author: James E. Vinson
Publisher: Springer Science & Business Media
Total Pages: 214
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461503213

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Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts.


ESD Design and Analysis Handbook
Language: en
Pages: 214
Authors: James E. Vinson
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practica
The ESD Handbook
Language: en
Pages: 1172
Authors: Steven H. Voldman
Categories: Technology & Engineering
Type: BOOK - Published: 2021-04-12 - Publisher: John Wiley & Sons

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A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a
ESD
Language: en
Pages: 260
Authors: Steven H. Voldman
Categories: Technology & Engineering
Type: BOOK - Published: 2011-04-04 - Publisher: John Wiley & Sons

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Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies
ESD
Language: en
Pages: 552
Authors: Steven H. Voldman
Categories: Technology & Engineering
Type: BOOK - Published: 2015-04-24 - Publisher: John Wiley & Sons

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ESD: Circuits and Devices 2nd Edition provides a clear picture of layout and design of digital, analog, radio frequency (RF) and power applications for protecti
Basic ESD and I/O Design
Language: en
Pages: 328
Authors: Sanjay Dabral
Categories: Computers
Type: BOOK - Published: 1998 - Publisher: Wiley-Interscience

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This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines