Evaluation Of Hot Carrier Induced Degradation In Mosfets By Measurement At Cryogenic Temperatures
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Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures
Author | : Sherry Shu Ting Yao |
Publisher | : |
Total Pages | : 200 |
Release | : 2000 |
Genre | : Low temperature engineering |
ISBN | : |
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