Failure Modes and Mechanisms in Electronic Packages

Failure Modes and Mechanisms in Electronic Packages
Author: P. Singh
Publisher: Springer Science & Business Media
Total Pages: 398
Release: 1997-11-30
Genre: Technology & Engineering
ISBN: 9780412105913
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With the proliferation of packaging technology, failure and reliability have become serious concerns. This invaluable reference details processes that enable detection, analysis and prevention of failures. It provides a comprehensive account of the failures of device packages, discrete component connectors, PCB carriers and PCB assemblies.


Failure Modes and Mechanisms in Electronic Packages
Language: en
Pages: 391

Failure Modes and Mechanisms in Electronic Packages

Authors: P. Singh
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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With the proliferation of packaging technology, failure and reliability have become serious concerns. This invaluable reference details processes that enable de
Reliability and Failure of Electronic Materials and Devices
Language: en
Pages: 759

Reliability and Failure of Electronic Materials and Devices

Authors: Milton Ohring
Categories: Technology & Engineering
Type: BOOK - Published: 2014-10-14 - Publisher: Academic Press

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Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of mo
Electronic Failure Analysis Handbook
Language: en
Pages: 770

Electronic Failure Analysis Handbook

Authors: Perry L. Martin
Categories: Technology & Engineering
Type: BOOK - Published: 1999 - Publisher: McGraw Hill Professional

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Annotation "In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniqu
Failure Analysis
Language: en
Pages: 372

Failure Analysis

Authors: Marius Bazu
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-08 - Publisher: John Wiley & Sons

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Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. T
Microelectronics Failure Analysis
Language: en
Pages: 813

Microelectronics Failure Analysis

Authors:
Categories: Technology & Engineering
Type: BOOK - Published: 2004-01-01 - Publisher: ASM International

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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the pr