High Level Test Methodology for Crosstalk Faults in Sequential Circuits

High Level Test Methodology for Crosstalk Faults in Sequential Circuits
Author: Marong Phadoongsidhi
Publisher:
Total Pages: 152
Release: 2004
Genre:
ISBN:

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High Level Test Methodology for Crosstalk Faults in Sequential Circuits
Language: en
Pages: 152
Authors: Marong Phadoongsidhi
Categories:
Type: BOOK - Published: 2004 - Publisher:

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Test Generation of Crosstalk Delay Faults in VLSI Circuits
Language: en
Pages: 161
Authors: S. Jayanthy
Categories: Technology & Engineering
Type: BOOK - Published: 2018-09-20 - Publisher: Springer

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This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk
Embedded Systems Handbook
Language: en
Pages: 1161
Authors: Richard Zurawski
Categories: Computers
Type: BOOK - Published: 2005-08-16 - Publisher: CRC Press

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Embedded systems are nearly ubiquitous, and books on individual topics or components of embedded systems are equally abundant. Unfortunately, for those designer
System-on-Chip Test Architectures
Language: en
Pages: 893
Authors: Laung-Terng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2010-07-28 - Publisher: Morgan Kaufmann

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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geom
EDA for IC System Design, Verification, and Testing
Language: en
Pages: 617
Authors: Louis Scheffer
Categories: Technology & Engineering
Type: BOOK - Published: 2018-10-03 - Publisher: CRC Press

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Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Auto