Hot Carrier Reliability Of Cmos Integrated Circuits
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Hot-carrier Reliability of CMOS Integrated Circuits
Author | : Jone Fang Chen |
Publisher | : |
Total Pages | : 242 |
Release | : 1998 |
Genre | : |
ISBN | : |
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As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design