Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature

Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature
Author: SeokWon Abraham Kim
Publisher:
Total Pages: 302
Release: 1999
Genre:
ISBN:
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Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature
Language: en
Pages: 302

Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature

Authors: SeokWon Abraham Kim
Categories:
Type: BOOK - Published: 1999 - Publisher:

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MOSFET Hot Carrier Reliability for Cryogenic Operation
Language: en
Pages: 232

MOSFET Hot Carrier Reliability for Cryogenic Operation

Authors: Miryeong Song
Categories:
Type: BOOK - Published: 1994 - Publisher:

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Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures
Language: en
Pages: 200

Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures

Authors: Sherry Shu Ting Yao
Categories: Low temperature engineering
Type: BOOK - Published: 2000 - Publisher:

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The Effect of Hot-carrier and Fowler-Nordheim Injection on VLSI MOSFET at Room and Cryogenic Temperatures
Language: en
Pages: 332

The Effect of Hot-carrier and Fowler-Nordheim Injection on VLSI MOSFET at Room and Cryogenic Temperatures

Authors: Jen-Tai Hsu
Categories:
Type: BOOK - Published: 1993 - Publisher:

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Low Temperature Electronics
Language: en
Pages: 985

Low Temperature Electronics

Authors: Edmundo A. Gutierrez-D.
Categories: Cryoelectronics
Type: BOOK - Published: 2001 - Publisher: Academic Press

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Summarizes the advances in cryoelectronics starting from the fundamentals in physics and semiconductor devices to electronic systems, hybrid superconductor-semi