ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis

ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher: ASM International
Total Pages: 666
Release: 2017-12-01
Genre: Technology & Engineering
ISBN: 1627081518

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The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.


ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis
Language: en
Pages: 666
Authors: ASM International
Categories: Technology & Engineering
Type: BOOK - Published: 2017-12-01 - Publisher: ASM International

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The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate i
ISTFA 2017
Language: en
Pages: 645
Authors:
Categories: Electronic apparatus and appliances
Type: BOOK - Published: 2017 - Publisher:

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ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Language: en
Pages: 540
Authors:
Categories: Technology & Engineering
Type: BOOK - Published: 2019-12-01 - Publisher: ASM International

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The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of
Microelectronics Fialure Analysis Desk Reference, Seventh Edition
Language: en
Pages: 750
Authors: Tejinder Gandhi
Categories: Technology & Engineering
Type: BOOK - Published: 2019-11-01 - Publisher: ASM International

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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM I
ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Language: en
Pages:
Authors:
Categories:
Type: BOOK - Published: 2018-12-01 - Publisher: ASM International

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The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to Novembe