Microwave Measurement Based Ic Interconnect Characterization Modeling And Simulation For High Speed Vlsi Circuit Design
Download Microwave Measurement Based Ic Interconnect Characterization Modeling And Simulation For High Speed Vlsi Circuit Design full books in PDF, epub, and Kindle. Read online free Microwave Measurement Based Ic Interconnect Characterization Modeling And Simulation For High Speed Vlsi Circuit Design ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design
Author | : Yungseon Eo |
Publisher | : |
Total Pages | : 460 |
Release | : 1993 |
Genre | : |
ISBN | : |
Download Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design Book in PDF, Epub and Kindle
Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design Related Books
Language: en
Pages: 460
Pages: 460
Type: BOOK - Published: 1993 - Publisher:
Language: en
Pages: 81
Pages: 81
Type: BOOK - Published: 2012-02-17 - Publisher: Springer Science & Business Media
Compact Models and Measurement Techniques for High-Speed Interconnects provides detailed analysis of issues related to high-speed interconnects from the perspec
Language: en
Pages: 310
Pages: 310
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
The appropriate interconnect model has changed several times over the past two decades due to the application of aggressive technology scaling. New, more accura
Language: en
Pages: 380
Pages: 380
Type: BOOK - Published: 2011-08-31 - Publisher: IGI Global
Monolithic Microwave Integrated Circuit (MMIC) is an electronic device that is widely used in all high frequency wireless systems. In developing MMIC as a produ
Language: en
Pages: 254
Pages: 254
Type: BOOK - Published: 1995 - Publisher:
With edge rates of high speed digital devices pushing into the sub-nano second range, interconnections with the associated packages play a major role in determi