Nanoscale Electronic Inhomogeneity in In_2Se_3 Nanoribbons Revealed by Microwave Impedance Microscopy
Language: en
Pages:
Authors:
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Type: BOOK - Published: 2010 - Publisher:

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Driven by interactions due to the charge, spin, orbital, and lattice degrees of freedom, nanoscale inhomogeneity has emerged as a new theme for materials with n
Imaging Nanoscale Electronic Inhomogeneity with Microwave Impedance Microscopy
Language: en
Pages:
Authors: Worasom Kundhikanjana
Categories:
Type: BOOK - Published: 2013 - Publisher:

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Ability to measure local dielectric constant and conductivity at nanoscale is desir- able for many research disciplines. Traditional transport measurements and
Atomic Force Microscopy for Energy Research
Language: en
Pages: 457
Authors: Cai Shen
Categories: Science
Type: BOOK - Published: 2022-04-26 - Publisher: CRC Press

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Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase,
Electrical Atomic Force Microscopy for Nanoelectronics
Language: en
Pages: 408
Authors: Umberto Celano
Categories: Science
Type: BOOK - Published: 2019-08-01 - Publisher: Springer

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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated
Scanning Probe Microscopy
Language: en
Pages: 330
Authors: Ernst Meyer
Categories: Science
Type: BOOK - Published: 2021-05-31 - Publisher: Springer Nature

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the expe