NC-AFM2001 : proceedings of the 4th International Conference on Noncontact Atomic Force Microscopy, Kyoto, Japan, September 1 - 5, 2001

NC-AFM2001 : proceedings of the 4th International Conference on Noncontact Atomic Force Microscopy, Kyoto, Japan, September 1 - 5, 2001
Author: International Conference on Non-Contact Atomic Force Microscopy
Publisher:
Total Pages: 11
Release: 2002
Genre: Atomic force microscopy
ISBN:

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NC-AFM2001 : proceedings of the 4th International Conference on Noncontact Atomic Force Microscopy, Kyoto, Japan, September 1 - 5, 2001
Language: en
Pages: 11
Authors: International Conference on Non-Contact Atomic Force Microscopy
Categories: Atomic force microscopy
Type: BOOK - Published: 2002 - Publisher:

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NC-AFM2001
Language: en
Pages: 11
Authors: Seizo Morita
Categories: Atomic force microscopy
Type: BOOK - Published: 2002 - Publisher:

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NC-AFM2001
Language: en
Pages: 330
Authors: Masaru Tsukada
Categories:
Type: BOOK - Published: 2002 - Publisher:

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Proceedings of the 4th International Conference on Noncontact Atomic Force Microscopy, Kyoto, Japan, September 01 - 05, 2001
Language: en
Pages:
Noncontact Atomic Force Microscopy
Language: en
Pages: 448
Authors: S. Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra