Optical Characterization of Bulk Gallium Arsenide Using Fourier Transform Infrared Spectroscopy

Optical Characterization of Bulk Gallium Arsenide Using Fourier Transform Infrared Spectroscopy
Author: Shangju Yang
Publisher:
Total Pages: 176
Release: 1992
Genre: Gallium arsenide
ISBN:

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Optical Characterization of Bulk Gallium Arsenide Using Fourier Transform Infrared Spectroscopy
Language: en
Pages: 176
Authors: Shangju Yang
Categories: Gallium arsenide
Type: BOOK - Published: 1992 - Publisher:

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Optical Characterization of Semiconductors
Language: en
Pages: 229
Authors: Sidney Perkowitz
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scatterin
Optical Characterization of Epitaxial Semiconductor Layers
Language: en
Pages: 446
Authors: Günther Bauer
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decad
Optical and Electrical Characterization of Melt-Grown Bulk Indium Gallium Arsenide and Indium Arsenic Phosphide Alloys
Language: en
Pages: 164
Authors: Jean Wei
Categories: Gallium arsenide
Type: BOOK - Published: 2012-10-29 - Publisher:

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A new method to determine semiconductor bandgap energy directly from the easily measured transmission spectra was developed. The method was verified using many
Journal of Research of the National Institute of Standards and Technology
Language: en
Pages: 904
Authors:
Categories: Chemistry
Type: BOOK - Published: 1994 - Publisher:

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Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering,