Optical Characterization of Semiconductors

Optical Characterization of Semiconductors
Author: Sidney Perkowitz
Publisher: Elsevier
Total Pages: 229
Release: 2012-12-02
Genre: Technology & Engineering
ISBN: 0080984274

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories


Optical Characterization of Semiconductors
Language: en
Pages: 229
Authors: Sidney Perkowitz
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-02 - Publisher: Elsevier

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This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scatterin
Optical Characterization of Semiconductors
Language: en
Pages: 240
Authors: Sidney Perkowitz
Categories: Science
Type: BOOK - Published: 1993-10-28 - Publisher: Academic Press

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Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the auth
Optical Characterization of Epitaxial Semiconductor Layers
Language: en
Pages: 446
Authors: Günther Bauer
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decad
Semiconductor Material and Device Characterization
Language: en
Pages: 800
Authors: Dieter K. Schroder
Categories: Technology & Engineering
Type: BOOK - Published: 2015-06-29 - Publisher: John Wiley & Sons

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This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characteri
Optical Characterization of Semiconductors
Language: en
Pages: 252
Authors: D.B. Kushev
Categories: Technology & Engineering
Type: BOOK - Published: 1992-01-01 - Publisher: Trans Tech Publications Ltd

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Key Engineering Materials Vol. 65