Path Delay Fault Testing for Digital VLSI Circuits Using Specialized Binary Decision Diagrams

Path Delay Fault Testing for Digital VLSI Circuits Using Specialized Binary Decision Diagrams
Author: Kyriakos A. Christou
Publisher:
Total Pages: 157
Release: 2012
Genre: Delay faults (Semiconductors)
ISBN:
GET BOOK

Download Path Delay Fault Testing for Digital VLSI Circuits Using Specialized Binary Decision Diagrams Book in PDF, Epub and Kindle


Path Delay Fault Testing for Digital VLSI Circuits Using Specialized Binary Decision Diagrams
Language: en
Pages: 157

Path Delay Fault Testing for Digital VLSI Circuits Using Specialized Binary Decision Diagrams

Authors: Kyriakos A. Christou
Categories: Delay faults (Semiconductors)
Type: BOOK - Published: 2012 - Publisher:

GET EBOOK

Delay Fault Testing for VLSI Circuits
Language: en
Pages: 201

Delay Fault Testing for VLSI Circuits

Authors: Angela Krstic
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

GET EBOOK

In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t
Assessing Fault Model and Test Quality
Language: en
Pages: 142

Assessing Fault Model and Test Quality

Authors: Kenneth M. Butler
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

GET EBOOK

For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The sta
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 712

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2004-12-15 - Publisher: Springer Science & Business Media

GET EBOOK

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
IDDQ Testing of VLSI Circuits
Language: en
Pages: 134

IDDQ Testing of VLSI Circuits

Authors: Ravi K. Gulati
Categories: Computers
Type: BOOK - Published: 1992-12-31 - Publisher: Springer Science & Business Media

GET EBOOK

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in th