Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy
Author: Ray Egerton
Publisher: Springer Science & Business Media
Total Pages: 224
Release: 2011-02-11
Genre: Technology & Engineering
ISBN: 9780387258003

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.


Physical Principles of Electron Microscopy
Language: en
Pages: 224
Authors: Ray Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Physical Principles of Electron Microscopy
Language: en
Pages: 210
Authors: R.F. Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-28 - Publisher: Springer Science & Business Media

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Physical Principles of Electron Microscopy
Language: en
Pages: 0
Authors: Ray Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2010-10-29 - Publisher: Springer

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Physical Principles of Electron Microscopy
Language: en
Pages: 203
Authors: R.F. Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2016-07-01 - Publisher: Springer

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Physical Principles of Electron Microscopy
Language: en
Pages: 202
Authors: Ray F. Egerton
Categories:
Type: BOOK - Published: 2007 - Publisher:

GET EBOOK