Reliability & Failure Analysis of Integrated Circuits (ICs) and Devices

Reliability & Failure Analysis of Integrated Circuits (ICs) and Devices
Author: Vijay K. Garg
Publisher:
Total Pages:
Release: 1995
Genre:
ISBN:

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Reliability & Failure Analysis of Integrated Circuits (ICs) and Devices
Language: en
Pages:
Authors: Vijay K. Garg
Categories:
Type: BOOK - Published: 1995 - Publisher:

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Integrated Circuit Failure Analysis
Language: en
Pages: 198
Authors: Friedrich Beck
Categories: Technology & Engineering
Type: BOOK - Published: 1998-02-04 - Publisher: John Wiley & Sons

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Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präpara
Failure Analysis of Integrated Circuits
Language: en
Pages: 256
Authors: Lawrence C. Wagner
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and technique
Failure Analysis
Language: en
Pages: 372
Authors: Marius Bazu
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-08 - Publisher: John Wiley & Sons

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Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. T
CMOS Electronics
Language: en
Pages: 370
Authors: Jaume Segura
Categories: Technology & Engineering
Type: BOOK - Published: 2004-03-26 - Publisher: John Wiley & Sons

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CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the fin