Soft-Matter Characterization

Soft-Matter Characterization
Author: Redouane Borsali
Publisher: Springer Science & Business Media
Total Pages: 1490
Release: 2008-07-28
Genre: Science
ISBN: 140204464X

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This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.


Soft-Matter Characterization
Language: en
Pages: 1490
Authors: Redouane Borsali
Categories: Science
Type: BOOK - Published: 2008-07-28 - Publisher: Springer Science & Business Media

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This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at
Soft-matter Characterization
Language: en
Pages: 0
Authors: Redouane Borsali
Categories:
Type: BOOK - Published: 2008 - Publisher:

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Soft matter characterization. 2(2008)
Language: en
Pages: 719
Authors: Redouane Borsali
Categories:
Type: BOOK - Published: 2008 - Publisher:

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Soft-Matter Characterization
Language: en
Pages: 1455
Authors: Redouane Borsali
Categories: Science
Type: BOOK - Published: 2021-01-14 - Publisher: Springer

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This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at
Microscopy Methods in Nanomaterials Characterization
Language: en
Pages: 434
Authors: Sabu Thomas
Categories: Technology & Engineering
Type: BOOK - Published: 2017-05-17 - Publisher: Elsevier

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Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterizati