Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits

Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits
Author: Kenneth Michael Butler
Publisher:
Total Pages: 294
Release: 1990
Genre: Digital integrated circuits
ISBN:

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Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits
Language: en
Pages: 294
Authors: Kenneth Michael Butler
Categories: Digital integrated circuits
Type: BOOK - Published: 1990 - Publisher:

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Assessing Fault Model and Test Quality
Language: en
Pages: 142
Authors: Kenneth M. Butler
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The sta
Models in Hardware Testing
Language: en
Pages: 263
Authors: Hans-Joachim Wunderlich
Categories: Computers
Type: BOOK - Published: 2009-11-12 - Publisher: Springer Science & Business Media

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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the
Test Pattern Generation using Boolean Proof Engines
Language: en
Pages: 192
Authors: Rolf Drechsler
Categories: Technology & Engineering
Type: BOOK - Published: 2009-04-30 - Publisher: Springer

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In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the
Models in Hardware Testing
Language: en
Pages: 257
Authors: Hans-Joachim Wunderlich
Categories: Computers
Type: BOOK - Published: 2010-04-29 - Publisher: Springer

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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the