Test and Diagnosis for Small-Delay Defects
Language: en
Pages: 228

Test and Diagnosis for Small-Delay Defects

Authors: Mohammad Tehranipoor
Categories: Technology & Engineering
Type: BOOK - Published: 2011-09-08 - Publisher: Springer Science & Business Media

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This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly
High-quality Test and Diagnosis for Small-delay Defects
Language: en
Pages: 426

High-quality Test and Diagnosis for Small-delay Defects

Authors: Ke Peng
Categories:
Type: BOOK - Published: 2010 - Publisher:

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Language: en
Pages: 266

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Authors: Sandeep K. Goel
Categories: Technology & Engineering
Type: BOOK - Published: 2017-12-19 - Publisher: CRC Press

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Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increase
Methodologies for Test and Diagnosis of Delay Defects in Integrated Circuits
Language: en
Pages: 208

Methodologies for Test and Diagnosis of Delay Defects in Integrated Circuits

Authors: Ahish Mysore Somashekar
Categories: Delay faults (Semiconductors)
Type: BOOK - Published: 2015 - Publisher:

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The failure of devices due to timing-related defects is becoming increasingly prominent in the nanometer era, thereby causing quality and reliability concerns.
Built-in Self Test (BIST) for Realistic Delay Defects
Language: en
Pages:

Built-in Self Test (BIST) for Realistic Delay Defects

Authors: Karthik Prabhu Tamilarasan
Categories:
Type: BOOK - Published: 2012 - Publisher:

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Testing of delay defects is necessary in deep submicron (DSM) technologies. High coverage delay tests produced by automatic test pattern generation (ATPG) can b