Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits

Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
Author: Yichuang Sun
Publisher: IET
Total Pages: 411
Release: 2008-05-30
Genre: Technology & Engineering
ISBN: 0863417450

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This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.


Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
Language: en
Pages: 411
Authors: Yichuang Sun
Categories: Technology & Engineering
Type: BOOK - Published: 2008-05-30 - Publisher: IET

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This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a
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Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especial
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