Testing Of Interposer Based 25d Integrated Circuits
Download Testing Of Interposer Based 25d Integrated Circuits full books in PDF, epub, and Kindle. Read online free Testing Of Interposer Based 25d Integrated Circuits ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Testing of Interposer-Based 2.5D Integrated Circuits
Author | : Ran Wang |
Publisher | : Springer |
Total Pages | : 192 |
Release | : 2017-03-20 |
Genre | : Technology & Engineering |
ISBN | : 3319547143 |
Download Testing of Interposer-Based 2.5D Integrated Circuits Book in PDF, Epub and Kindle
This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies. This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable.
Testing of Interposer-Based 2.5D Integrated Circuits Related Books
Pages: 192
Pages: 310
Pages: 248
Pages: 411
Pages: 212