The Physics and Chemistry of SiO2 and the Si-SiO2 Interface-3, 1996

The Physics and Chemistry of SiO2 and the Si-SiO2 Interface-3, 1996
Author: Hisham Z. Massoud
Publisher:
Total Pages: 804
Release: 1996
Genre: Science
ISBN:

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The Physics and Chemistry of SiO2 and the Si-SiO2 Interface-3, 1996
Language: en
Pages: 804
Authors: Hisham Z. Massoud
Categories: Science
Type: BOOK - Published: 1996 - Publisher:

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The Physics and Chemistry of SiO2 and the Si-SiO2 Interface--4, 2000
Language: en
Pages: 562
Authors: Hisham Z. Massoud
Categories: Nature
Type: BOOK - Published: 2000 - Publisher:

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The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2
Language: en
Pages: 505
Authors: B.E. Deal
Categories: Science
Type: BOOK - Published: 2013-11-09 - Publisher: Springer Science & Business Media

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The first international symposium on the subject "The Physics and Chemistry of Si02 and the Si-Si02 Interface," organized in association with the Electrochemica
The Physics and Chemistry of Sio2 and the Si-Sio2 Interface
Language: en
Pages: 572
Authors: B. E. Deal
Categories:
Type: BOOK - Published: 2014-01-15 - Publisher:

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The Physics and Chemistry of SiO2 and the Si-SiO2 Interface--5
Language: en
Pages: 304
Authors: Hisham Z. Massoud
Categories: Dielectrics
Type: BOOK - Published: 2005-01-01 - Publisher: ECS Transactions

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This issue of ECS Transactions places a focus on ultrathin gate dielectrics: novel technologies, characterization methods, process modeling, fundamental limits,