The Principles and Practice of Electron Microscopy

The Principles and Practice of Electron Microscopy
Author: Ian M. Watt
Publisher: Cambridge University Press
Total Pages: 506
Release: 1997-01-30
Genre: Science
ISBN: 9780521435918

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The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.


The Principles and Practice of Electron Microscopy
Language: en
Pages: 506
Authors: Ian M. Watt
Categories: Science
Type: BOOK - Published: 1997-01-30 - Publisher: Cambridge University Press

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The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological
Physical Principles of Electron Microscopy
Language: en
Pages: 224
Authors: Ray Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Principles and Practice of Electron Microscope Operation
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Pages: 368
Authors: Alan W. Agar
Categories: Electron microscopes
Type: BOOK - Published: 1974 - Publisher:

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Physical Principles of Electron Microscopy
Language: en
Pages: 203
Authors: R.F. Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2016-07-01 - Publisher: Springer

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
Principles and Practice of Electron Microscope Operation
Language: en
Pages: 345
Authors: A.M. Glauert
Categories:
Type: BOOK - Published: 1974 - Publisher:

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