Thermal Testing of Integrated Circuits

Thermal Testing of Integrated Circuits
Author: J. Altet
Publisher: Springer Science & Business Media
Total Pages: 212
Release: 2013-03-09
Genre: Technology & Engineering
ISBN: 1475736355
GET BOOK

Download Thermal Testing of Integrated Circuits Book in PDF, Epub and Kindle

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.


Thermal Testing of Integrated Circuits
Language: en
Pages: 212

Thermal Testing of Integrated Circuits

Authors: J. Altet
Categories: Technology & Engineering
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media

GET EBOOK

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of
Thermal and Power Management of Integrated Circuits
Language: en
Pages: 188

Thermal and Power Management of Integrated Circuits

Authors: Arman Vassighi
Categories: Technology & Engineering
Type: BOOK - Published: 2006-06-01 - Publisher: Springer Science & Business Media

GET EBOOK

In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress
Thermal Issues in Testing of Advanced Systems on Chip
Language: en
Pages: 219

Thermal Issues in Testing of Advanced Systems on Chip

Authors: Nima Aghaee Ghaleshahi
Categories:
Type: BOOK - Published: 2015-09-23 - Publisher: Linköping University Electronic Press

GET EBOOK

Many cutting-edge computer and electronic products are powered by advanced Systems-on-Chip (SoC). Advanced SoCs encompass superb performance together with large
Theory and Practice of Thermal Transient Testing of Electronic Components
Language: en
Pages: 389

Theory and Practice of Thermal Transient Testing of Electronic Components

Authors: Marta Rencz
Categories: Technology & Engineering
Type: BOOK - Published: 2023-01-23 - Publisher: Springer Nature

GET EBOOK

This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today.
Junction-Level Thermal Analysis of Three Dimensional Integrated Circuits
Language: en
Pages: 192

Junction-Level Thermal Analysis of Three Dimensional Integrated Circuits

Authors: Samson Louis Benjamin Melamed
Categories:
Type: BOOK - Published: 2011 - Publisher:

GET EBOOK