Tutorial, Test Generation for VLSI Circuits

Tutorial, Test Generation for VLSI Circuits
Author: Sharad C. Seth
Publisher:
Total Pages: 102
Release: 1987
Genre: Integrated circuits
ISBN:
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Tutorial, Test Generation for VLSI Circuits
Language: en
Pages: 102

Tutorial, Test Generation for VLSI Circuits

Authors: Sharad C. Seth
Categories: Integrated circuits
Type: BOOK - Published: 1987 - Publisher:

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Tutorial Test Generation for VLSI Chips
Language: en
Pages: 426

Tutorial Test Generation for VLSI Chips

Authors: Vishwani D. Agrawal
Categories: Computers
Type: BOOK - Published: 1988 - Publisher: IEEE Computer Society Press

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Tutorial--VLSI Testing & Validation Techniques
Language: en
Pages: 630

Tutorial--VLSI Testing & Validation Techniques

Authors: Hassan K. Reghbati
Categories: Technology & Engineering
Type: BOOK - Published: 1985 - Publisher:

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
Delay Fault Testing for VLSI Circuits
Language: en
Pages: 201

Delay Fault Testing for VLSI Circuits

Authors: Angela Krstic
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, t