Ultrahigh Vacuum Scanning Electron Microscopy and Special Effects in Secondary Emission Electron Spectroscopy

Ultrahigh Vacuum Scanning Electron Microscopy and Special Effects in Secondary Emission Electron Spectroscopy
Author: Dale Everett Miller
Publisher:
Total Pages: 286
Release: 1981
Genre: Dissertations, Academic
ISBN:

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Ultrahigh Vacuum Scanning Electron Microscopy and Special Effects in Secondary Emission Electron Spectroscopy
Language: en
Pages: 286
Authors: Dale Everett Miller
Categories: Dissertations, Academic
Type: BOOK - Published: 1981 - Publisher:

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Scanning Auger Electron Microscopy
Language: en
Pages: 384
Authors: Martin Prutton
Categories: Technology & Engineering
Type: BOOK - Published: 2006-05-01 - Publisher: John Wiley & Sons

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This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlyi
A Review: Ultrahigh-Vacuum Technology for Electron Microscopes
Language: en
Pages: 575
Authors: Nagamitsu Yoshimura
Categories: Technology & Engineering
Type: BOOK - Published: 2020-02-15 - Publisher: Academic Press

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A Review: Ultrahigh-Vacuum Technology for Electron Microscopes provides information on the fundamentals of ultra-high vacuum systems. It covers the very subtle
The Use of the Scanning Electron Microscope
Language: en
Pages: 300
Authors: J. W. S. Hearle
Categories: Science
Type: BOOK - Published: 1972 - Publisher: Pergamon

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Scanning Electron Microscopy
Language: en
Pages: 538
Authors: Ludwig Reimer
Categories: Science
Type: BOOK - Published: 2013-11-11 - Publisher: Springer

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and