Using Fine Grain Approaches For Highly Reliable Design Of Fpga Based Systems In Space
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Using Fine Grain Approaches for Highly Reliable Design of FPGA-based Systems in Space
Author | : Mahtab Niknahad |
Publisher | : KIT Scientific Publishing |
Total Pages | : 164 |
Release | : 2014-05-22 |
Genre | : Technology & Engineering |
ISBN | : 3731500388 |
Download Using Fine Grain Approaches for Highly Reliable Design of FPGA-based Systems in Space Book in PDF, Epub and Kindle
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
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