Analysis of crosstalk effects and test generation for crosstalk glitches in VLSI digital circuits
Language: en
Pages: 108

Analysis of crosstalk effects and test generation for crosstalk glitches in VLSI digital circuits

Authors: Kyung Tek Lee
Categories:
Type: BOOK - Published: 1996 - Publisher:

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Test Generation of Crosstalk Delay Faults in VLSI Circuits
Language: en
Pages: 161

Test Generation of Crosstalk Delay Faults in VLSI Circuits

Authors: S. Jayanthy
Categories: Technology & Engineering
Type: BOOK - Published: 2018-09-20 - Publisher: Springer

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This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk
Crosstalk fault test generation and hierarchical timing verification in VLSI digital circuits
Language: en
Pages: 214

Crosstalk fault test generation and hierarchical timing verification in VLSI digital circuits

Authors: Kyung Tek Lee
Categories: Integrated circuits
Type: BOOK - Published: 1999 - Publisher:

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16th IEEE VLSI Test Symposium
Language: en
Pages: 520

16th IEEE VLSI Test Symposium

Authors:
Categories: Application-specific integrated circuits
Type: BOOK - Published: 1998 - Publisher:

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Electronic Design Automation for IC System Design, Verification, and Testing
Language: en
Pages: 773

Electronic Design Automation for IC System Design, Verification, and Testing

Authors: Luciano Lavagno
Categories: Technology & Engineering
Type: BOOK - Published: 2017-12-19 - Publisher: CRC Press

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The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design