Anomalous X-Ray Scattering for Materials Characterization
Language: en
Pages: 224
Authors: Yoshio Waseda
Categories: Technology & Engineering
Type: BOOK - Published: 2003-07-01 - Publisher: Springer

GET EBOOK

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi
Novel Application of Anomalous (resonance) X-ray Scattering for Structural Characterization of Disordered Materials
Language: en
Pages: 204
Authors: Yoshio Waseda
Categories: Science
Type: BOOK - Published: 1984 - Publisher: Springer

GET EBOOK

Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials
Language: en
Pages: 196
Structural Characterization of Non-crystalline Materials by Anomalous (resonance) X-ray Scattering
Language: en
Pages: 23
Characterization of Steels by Anomalous Small-angle X-ray Scattering
Language: en
Pages:
Authors: Peter René Jemian
Categories:
Type: BOOK - Published: 1990 - Publisher:

GET EBOOK