Applied Scanning Probe Methods VIII

Applied Scanning Probe Methods VIII
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
Total Pages: 512
Release: 2007-12-20
Genre: Technology & Engineering
ISBN: 3540740805

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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.


Applied Scanning Probe Methods VIII
Language: en
Pages: 512
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2007-12-20 - Publisher: Springer Science & Business Media

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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to sum
Applied Scanning Probe Methods II
Language: en
Pages: 456
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2006-06-22 - Publisher: Springer Science & Business Media

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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cisio
Applied Scanning Probe Methods III
Language: en
Pages: 378
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2009-09-02 - Publisher: Springer

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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre-
Applied Scanning Probe Methods IV
Language: en
Pages: 318
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-28 - Publisher: Springer Science & Business Media

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Applied Scanning Probe Methods XI
Language: en
Pages: 281
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-22 - Publisher: Springer Science & Business Media

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a