Conference On Applied Crystallography

This book aims to propagate the newest achievements of applied crystallography among crystallographers, solid state physicists and materials scientists. It presents application of structural studies to materials used in industrial practice rather than those associated with the crystal structure determination only. The proceedings have been selected for coverage in: . OCo Materials Science Citation Index-. OCo Index to Scientific & Technical Proceedings- (ISTP- / ISI Proceedings). OCo Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings). OCo CC Proceedings OCo Engineering & Physical Sciences. Contents: Ultra High Angle Double-Crystal X-Ray Diffractometry (U-HADOX) (A Okazaki & K Munakata); Microstructure and Lattice Defect Analysis of Highly Deformed Materials by XRD Line Profile Modelling (P Scardi); Beyond the Ability of Rietveld Analysis: Whole-Pattern Fitting Based on the Maximum-Entropy Method (F Izumi); Six-Dimensional Texture Analysis with High-Energy Synchrotron Radiation (H J Bunge); Present State of Knowledge on Quasicrystals (W Steurer); and other papers. Readership: Graduate students, academics and researchers in applied crystallography and materials science."