Current Comparator Design for IDDQ Testing in VLSI Circuits

Current Comparator Design for IDDQ Testing in VLSI Circuits
Author: Umesh Mehta
Publisher:
Total Pages: 210
Release: 1996
Genre: Iddq testing
ISBN:

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Current Comparator Design for IDDQ Testing in VLSI Circuits
Language: en
Pages: 210
Authors: Umesh Mehta
Categories: Iddq testing
Type: BOOK - Published: 1996 - Publisher:

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IDDQ Testing of VLSI Circuits
Language: en
Pages: 121
Authors: Ravi K. Gulati
Categories: Computers
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in th
Introduction to IDDQ Testing
Language: en
Pages: 336
Authors: S. Chakravarty
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of inp
IDDQ testing of VLSI circuits
Language: en
Pages:
Authors: Chuck Hawkins
Categories:
Type: BOOK - Published: 1995 - Publisher:

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Iddq Testing for CMOS VLSI
Language: en
Pages: 216
Authors: Rochit Rajsuman
Categories: Technology & Engineering
Type: BOOK - Published: 1995 - Publisher: Artech House Publishers

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This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides