Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy
Author: Ray Egerton
Publisher: Springer Science & Business Media
Total Pages: 224
Release: 2011-02-11
Genre: Technology & Engineering
ISBN: 9780387258003

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.


Physical Principles of Electron Microscopy
Language: en
Pages: 224
Authors: Ray Egerton
Categories: Technology & Engineering
Type: BOOK - Published: 2011-02-11 - Publisher: Springer Science & Business Media

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor indus
A Beginners' Guide to Scanning Electron Microscopy
Language: en
Pages: 422
Authors: Anwar Ul-Hamid
Categories: Technology & Engineering
Type: BOOK - Published: 2018-10-26 - Publisher: Springer

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This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no bac
The Principles and Practice of Electron Microscopy
Language: en
Pages: 506
Authors: Ian M. Watt
Categories: Science
Type: BOOK - Published: 1997-01-30 - Publisher: Cambridge University Press

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The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological
Scanning Electron Microscopy
Language: en
Pages: 538
Authors: Ludwig Reimer
Categories: Science
Type: BOOK - Published: 2013-11-11 - Publisher: Springer

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and
Transmission Electron Microscopy
Language: en
Pages: 543
Authors: C. Barry Carter
Categories: Technology & Engineering
Type: BOOK - Published: 2016-08-24 - Publisher: Springer

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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussio