Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures

Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures
Author: Sherry Shu Ting Yao
Publisher:
Total Pages: 200
Release: 2000
Genre: Low temperature engineering
ISBN:
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Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures
Language: en
Pages: 200

Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures

Authors: Sherry Shu Ting Yao
Categories: Low temperature engineering
Type: BOOK - Published: 2000 - Publisher:

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Evaluation and Modelling of Hot-carrier Induced Degradation in MOSFETs by Gate-to-drain Capacitance Measurement
Language: en
Pages: 220

Evaluation and Modelling of Hot-carrier Induced Degradation in MOSFETs by Gate-to-drain Capacitance Measurement

Authors: Ramin Ghodsi
Categories: Metal oxide semiconductor field-effect transistors
Type: BOOK - Published: 1994 - Publisher:

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Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature
Language: en
Pages: 302

Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature

Authors: SeokWon Abraham Kim
Categories:
Type: BOOK - Published: 1999 - Publisher:

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Characterization of Hot-carriers Induced Degradation in Mosfets Through Gate Capacitances Measurement at Room and Cryogenic Temperatures
Language: en
Pages: 220

Characterization of Hot-carriers Induced Degradation in Mosfets Through Gate Capacitances Measurement at Room and Cryogenic Temperatures

Authors: Clement Che Ta Hsu
Categories: Hot-carriers
Type: BOOK - Published: 2001 - Publisher:

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Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements
Language: en
Pages: 382

Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements

Authors: Suat Eng Tan
Categories: Hot carriers
Type: BOOK - Published: 1997 - Publisher:

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