Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials

Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials
Author: Y. Waseda
Publisher:
Total Pages: 196
Release: 2014-10-01
Genre:
ISBN: 9783662173701

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Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials
Language: en
Pages: 196
Novel Application of Anomalous (resonance) X-ray Scattering for Structural Characterization of Disordered Materials
Language: en
Pages: 204
Authors: Yoshio Waseda
Categories: Science
Type: BOOK - Published: 1984 - Publisher: Springer

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Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials
Language: en
Pages: 196
Authors: Y. Waseda
Categories: Science
Type: BOOK - Published: 1984 - Publisher: Springer

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Anomalous X-Ray Scattering for Materials Characterization
Language: en
Pages: 224
Authors: Yoshio Waseda
Categories: Technology & Engineering
Type: BOOK - Published: 2003-07-01 - Publisher: Springer

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The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi
Structural Characterization of Non-crystalline Materials by Anomalous (resonance) X-ray Scattering
Language: en
Pages: 23