Path Delay Fault Testing For Digital Vlsi Circuits Using Specialized Binary Decision Diagrams
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Path Delay Fault Testing for Digital VLSI Circuits Using Specialized Binary Decision Diagrams
Author | : Kyriakos A. Christou |
Publisher | : |
Total Pages | : 157 |
Release | : 2012 |
Genre | : Delay faults (Semiconductors) |
ISBN | : |
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