Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy

Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy
Author: Roland Bennewitz
Publisher:
Total Pages: 9
Release: 2000
Genre:
ISBN:

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Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy
Language: en
Pages: 9
Authors: Roland Bennewitz
Categories:
Type: BOOK - Published: 2000 - Publisher:

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NC-AFM'99
Language: en
Pages: 222
Authors:
Categories: Atomic force microscopy
Type: BOOK - Published: 2000 - Publisher:

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Noncontact Atomic Force Microscopy
Language: en
Pages: 448
Authors: S. Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra
Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy
Language: en
Pages: 212
Authors: Seizō Morita
Categories:
Type: BOOK - Published: 1999 - Publisher:

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Proceedings of the 5th International Conference on Noncontact Atomic Force Microscopy
Language: en
Pages:
Authors: P M Hoffmann
Categories:
Type: BOOK - Published: 2003 - Publisher:

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