Semiconductor Memories, 2 Volume Set

Semiconductor Memories, 2 Volume Set
Author: Ashok K. Sharma
Publisher: Wiley-IEEE Press
Total Pages: 0
Release: 2003-01-30
Genre: Technology & Engineering
ISBN: 9780471462439

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Details the latest SRAM developments Explains how to use advanced memory configurations Covers memory chip to system level designs including megabyte and gigabyte mass storage memories Also covers radiation effects on these technologies for use in military and space applications This book will be a valuable resource for those interested in: how to use advanced memory configurations memory chip to system level designs including megabyte and gigabyte mass storage memories and radiation effects on these technologies for use in military and space applications


Semiconductor Memories, 2 Volume Set
Language: en
Pages: 0
Authors: Ashok K. Sharma
Categories: Technology & Engineering
Type: BOOK - Published: 2003-01-30 - Publisher: Wiley-IEEE Press

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Details the latest SRAM developments Explains how to use advanced memory configurations Covers memory chip to system level designs including megabyte and gigaby
Semiconductor Memories and Systems
Language: en
Pages: 364
Authors: Andrea Redaelli
Categories: Technology & Engineering
Type: BOOK - Published: 2022-06-07 - Publisher: Woodhead Publishing

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Semiconductor Memories and Systems provides a comprehensive overview of the current state of semiconductor memory at the technology and system levels. After an
Semiconductor Memory Devices and Circuits
Language: en
Pages: 249
Authors: Shimeng Yu
Categories: Technology & Engineering
Type: BOOK - Published: 2022-04-19 - Publisher: CRC Press

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This book covers semiconductor memory technologies from device bit-cell structures to memory array design with an emphasis on recent industry scaling trends and
Nonvolatile Memories
Language: en
Pages:
Authors: Tseung-Yuen Tseng
Categories: Flash memories (Computers)
Type: BOOK - Published: 2012 - Publisher:

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Testing Semiconductor Memories
Language: en
Pages: 542
Authors: A. J. van de Goor
Categories: Technology & Engineering
Type: BOOK - Published: 1991 - Publisher: John Wiley & Sons

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Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is