Tutorial Test Generation For Vlsi Chips
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Tutorial Test Generation for VLSI Chips
| Author | : Vishwani D. Agrawal |
| Publisher | : IEEE Computer Society |
| Total Pages | : 401 |
| Release | : 1988 |
| Genre | : Technology & Engineering |
| ISBN | : 9780818687860 |
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Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.
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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
