X Ray Line Profile Analysis In Materials Science
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X-Ray Line Profile Analysis in Materials Science
Author | : Gubicza, Jen? |
Publisher | : IGI Global |
Total Pages | : 359 |
Release | : 2014-03-31 |
Genre | : Technology & Engineering |
ISBN | : 1466658533 |
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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
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