X-ray Scattering from Semiconductors
Language: en
Pages: 303
Authors: Paul F. Fewster
Categories: Science
Type: BOOK - Published: 2000 - Publisher: World Scientific

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X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques
X-ray Scattering From Semiconductors
Language: en
Pages: 303
Authors: Paul F Fewster
Categories: Science
Type: BOOK - Published: 2000-10-27 - Publisher: World Scientific

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X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques
X-Ray Scattering from Semiconductors and Other Materials
Language: en
Pages: 510
Authors: Paul F. Fewster
Categories: Science
Type: BOOK - Published: 2015 - Publisher: World Scientific

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This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles an
X-Ray Metrology in Semiconductor Manufacturing
Language: en
Pages: 304
Authors: D. Keith Bowen
Categories: Technology & Engineering
Type: BOOK - Published: 2018-10-03 - Publisher: CRC Press

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The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials
X-ray Scattering From Semiconductors (2nd Edition)
Language: en
Pages: 315
Authors: Paul F Fewster
Categories: Technology & Engineering
Type: BOOK - Published: 2003-07-07 - Publisher: World Scientific

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This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations ca